Defect states in nc-Si:H films investigated by surface photovoltage spectroscopy

Daniela Cavalcoli, Marco Rossi, Anna Cavallini
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3553583
The author haven't finished explaining this publicationThe author haven't finished explaining this publication
The following have contributed to this page: Daniela Cavalcoli