Structural and electronic characterization of (2,33) bar-shaped stacking fault in 4H-SiC epitaxial layers

  • Massimo Camarda, Andrea Canino, Antonino La Magna, Francesco La Via, G. Feng, T. Kimoto, M. Aoki, H. Kawanowa
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3551542

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http://dx.doi.org/10.1063/1.3551542

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