Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device

H. A. Sakaue, N. Yamamoto, S. Morita, N. Nakamura, C. Chen, D. Kato, H. Kikuchi, I. Murakami, S. Ohtani, H. Tanuma, T. Watanabe, H. Tawara
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3549707
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