Diagnosis of low-frequency noise sources in contact resistance of staggered organic transistors

  • Y. Xu, R. Gwoziecki, R. Coppard, M. Benwadih, T. Minari, K. Tsukagoshi, J. A. Chroboczek, F. Balestra, G. Ghibaudo
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3544583

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