Scaling analysis of submicrometer nickel-oxide-based resistive switching memory devices

D. Ielmini, S. Spiga, F. Nardi, C. Cagli, A. Lamperti, E. Cianci, M. Fanciulli
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3544499
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