Native defects in Al[sub 2]O[sub 3] and their impact on III-V/Al[sub 2]O[sub 3] metal-oxide-semiconductor-based devices

J. R. Weber, A. Janotti, C. G. Van de Walle
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3544310