Voltage-induced recovery of dielectric breakdown (high current resistance switching) in HfO2

  • F. El Kamel, P. Gonon, C. Vallée, V. Jousseaume, H. Grampeix
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3541961

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http://dx.doi.org/10.1063/1.3541961

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