An electrode-free method of characterizing the microwave dielectric properties of high-permittivity thin films

V. Bovtun, V. Pashkov, M. Kempa, S. Kamba, A. Eremenko, V. Molchanov, Y. Poplavko, Y. Yakymenko, J. H. Lee, D. G. Schlom
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3537835
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