Dependence on diameter and growth direction of apparent strain to failure of Si nanowires

M. S. Steighner, L. P. Snedeker, B. L. Boyce, K. Gall, D. C. Miller, C. L. Muhlstein
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3537658
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