Effects of Ti incorporation on the interface properties and band alignment of HfTaO[sub x] thin films on sulfur passivated GaAs

T. Das, C. Mahata, C. K. Maiti, E. Miranda, G. Sutradhar, P. K. Bose
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3536520