Effects of point defects on thermal and thermoelectric properties of InN

  • A. X. Levander, T. Tong, K. M. Yu, J. Suh, D. Fu, R. Zhang, H. Lu, W. J. Schaff, O. Dubon, W. Walukiewicz, D. G. Cahill, J. Wu
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3536507

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http://dx.doi.org/10.1063/1.3536507

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