Publisher’s Note: “X-ray photoelectron spectroscopy study of the chemical interaction at the Pd/SiC interface” [J. Appl. Phys. 108, 093702 (2010)]

Y. Zhang, G. Gajjala, T. Hofmann, L. Weinhardt, M. Bär, C. Heske, M. Seelmann-Eggebert, P. Meisen
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3532951