Publisher’s Note: “Application of electron backscatter diffraction to the study on orientation distribution of intermetallic compounds at heterogeneous interfaces (Sn/Ag and Sn/Cu)” [J. Appl. Phys. 108, 103518 (2010)]

H. F. Zou, Z. F. Zhang
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3532093