Thermal exchange bias field drift in field cooled Mn[sub 83]Ir[sub 17]/Co[sub 70]Fe[sub 30] thin films after 10 keV He ion bombardment

Arno Ehresmann, Christoph Schmidt, Tanja Weis, Dieter Engel
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3532046
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