Aging- and annealing-induced variations in Nb/Al–AlO[sub x]/Nb tunnel junction properties

Alexey B. Pavolotsky, Dimitar Dochev, Victor Belitsky
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3532040

The following have contributed to this page: Alexey Pavolotsky