Nanoscale probing of dielectric breakdown at SiO[sub 2]/3C-SiC interfaces

Jens Eriksson, Fabrizio Roccaforte, Patrick Fiorenza, Ming-Hung Weng, Filippo Giannazzo, Jean Lorenzzi, Nikoletta Jegenyes, Gabriel Ferro, Vito Raineri
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3525806