Polarization fatigue in PbZr0.45Ti0.55O3-based capacitors studied from high resolution synchrotron x-ray diffraction

  • N. Menou, Ch. Muller, I. S. Baturin, V. Ya. Shur, J.-L. Hodeau
  • Journal of Applied Physics, March 2005, American Institute of Physics
  • DOI: 10.1063/1.1870098

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http://dx.doi.org/10.1063/1.1870098

The following have contributed to this page: Vladimir Shur