Differential interference contrast x-ray microscopy with submicron resolution

  • Thomas Wilhein, Burkhard Kaulich, Enzo Di Fabrizio, Fillipo Romanato, Stefano Cabrini, Jean Susini
  • Applied Physics Letters, April 2001, American Institute of Physics
  • DOI: 10.1063/1.1360776

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http://dx.doi.org/10.1063/1.1360776

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