Highly sensitive reflection high-energy electron diffraction measurement by use of micro-channel imaging plate

  • Koichiro Saiki, Takaomi Kono, Keiji Ueno, Atsushi Koma
  • Review of Scientific Instruments, September 2000, American Institute of Physics
  • DOI: 10.1063/1.1287625

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http://dx.doi.org/10.1063/1.1287625

The following have contributed to this page: Professor Koichiro Saiki