Comparison between two device structures of SPR enhanced UV detectors based on ZnO

  • Gaoming Li, Jingwen Zhang, Guangde Chen, Xun Hou
  • The European Physical Journal Applied Physics, October 2017, EDP Sciences
  • DOI: 10.1051/epjap/2017170196

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http://dx.doi.org/10.1051/epjap/2017170196