What is it about?

In the last years, subspace-based multi-view face recognition has attracted increasing attention and many related methods have been proposed. However, the most existing methods ignore the specific local structure of different views. This drawback can cause these methods' discriminating ability to degrade when many noisy samples exist in data. To tackle this problem, a multi-view low-rank representation method is proposed, which exploits both intrinsic relationships and specific local structures of different views simultaneously. It is achieved by hierarchical Bayesian methods that constrain the low-rank representation of each view so that it matches a linear combination of an intrinsic representation matrix and a specific representation matrix to obtain common and specific characteristics of different views. The intrinsic representation matrix holds the consensus information between views, and the specific representation matrices indicate the diversity among views. Furthermore , the model injects a clustering structure into the low-rank representation. This approach allows for adaptive adjustment of the clustering structure while pursuing the optimization of the low-rank representation. Hence, the model can well capture both the relationship between data and the clustering structure explicitly. Extensive experiments on several datasets demonstrated the effectiveness of the proposed method compared to similar state-of-the-art methods in classification and clustering.

Featured Image

Why is it important?

This work looks at Multiview learning from two directions to improve clustering accuracy. The effectiveness of this approach is substantially demonstrated on several benchmark datasets.

Perspectives

This work will interest readers with interest in Multiview clustering.

Stanley Ebhohimhen Abhadiomhen
University of Nigeria

Read the Original

This page is a summary of: Multi‐view intrinsic low‐rank representation for robust face recognition and clustering, IET Image Processing, May 2021, the Institution of Engineering and Technology (the IET),
DOI: 10.1049/ipr2.12232.
You can read the full text:

Read

Contributors

The following have contributed to this page