What is it about?
Measurement uncertainty limit analysis of biased estimators in RFID multiple tags system
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Why is it important?
This study could be used as an evaluation tool for the measurement uncertainty limit of biased estimators.
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This page is a summary of: Measurement uncertainty limit analysis of biased estimators in RFID multiple tags system, IET Science Measurement & Technology, August 2016, the Institution of Engineering and Technology (the IET),
DOI: 10.1049/iet-smt.2015.0202.
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