Probabilistic model for nanocell reliability evaluation in presence of transient errors

Renu Kumawat, Vineet Sahula, Manoj Singh Gaur
  • IET Computers & Digital Techniques, July 2015, the Institution of Engineering and Technology (the IET)
  • DOI: 10.1049/iet-cdt.2014.0124

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http://dx.doi.org/10.1049/iet-cdt.2014.0124

The following have contributed to this page: Professor Vineet Sahula