Improvement of current drivability in high-scalable tunnel field-effect transistors with CMOS compatible self-aligned process

S.W. Kim, B.-G. Park, M.-C. Sun, D.W. Kwon, E. Park, J.H. Kim
  • Electronics Letters, June 2016, the Institution of Engineering and Technology (the IET)
  • DOI: 10.1049/el.2016.0707

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http://dx.doi.org/10.1049/el.2016.0707

The following have contributed to this page: Professor Byung Gook Park