Fast method to determine an area of vulnerability for stochastic prediction of voltage sags

C.H. Park, G. Jang
  • IEE Proceedings - Generation Transmission and Distribution, January 2005, the Institution of Engineering and Technology (the IET)
  • DOI: 10.1049/ip-gtd:20050082
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http://dx.doi.org/10.1049/ip-gtd:20050082

The following have contributed to this page: Chang-Hyun Park