Publication not explained

This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.

If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.

Featured Image

Read the Original

This page is a summary of: Randomised multi-modulo residue number system architecture for double-and-add to prevent power analysis side channel attacks, IET Circuits Devices & Systems, September 2013, the Institution of Engineering and Technology (the IET), DOI: 10.1049/iet-cds.2012.0367.
You can read the full text:



The following have contributed to this page