X-ray tomographic imaging of Ti/SiC composites

S. A. Mcdonald, M. Preuss, E. Maire, J.-Y. Buffiere, P. M. Mummery, P. J. Withers
  • Journal of Microscopy, February 2003, Wiley
  • DOI: 10.1046/j.1365-2818.2003.01105.x

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Professor Philip J Withers