X-ray tomographic imaging of Ti/SiC composites

S. A. Mcdonald, M. Preuss, E. Maire, J.-Y. Buffiere, P. M. Mummery, P. J. Withers
  • Journal of Microscopy, February 2003, Wiley
  • DOI: 10.1046/j.1365-2818.2003.01105.x

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http://dx.doi.org/10.1046/j.1365-2818.2003.01105.x

The following have contributed to this page: Professor Philip J Withers