What is it about?

The article discusses how the occurrence of at least two different boron species in acidic silicon digests affects boron quantification by ICP-OES. A strategy for accurate quantification of boron in silicon is presented and results are cross validated against prompt gamma activation analysis.

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Why is it important?

Ultimately, accurate quantification of boron in silicon will improve in spec production of silicon grades where the boron content is a critical parameter. This includes specifically materials related to high purity silicon production for the photvoltaic industry using metallurigcal processes.

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This page is a summary of: Boron speciation in acid digests of metallurgical grade silicon reveals problem for accurate boron quantification by inductively coupled plasma – optical emission spectroscopy, Journal of Analytical Atomic Spectrometry, January 2014, Royal Society of Chemistry,
DOI: 10.1039/c3ja50383f.
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