Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

  • Elżbieta Świętek, Kacper Pilarczyk, Justyna Derdzińska, Konrad Szaciłowski, Wojciech Macyk
  • Physical Chemistry Chemical Physics, January 2013, Royal Society of Chemistry
  • DOI: 10.1039/c3cp52129j

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http://dx.doi.org/10.1039/c3cp52129j

The following have contributed to this page: Konrad Szacilowski and Mr Kacper Pilarczyk