An electrospray/inductively coupled plasma dual-source time-of-flight mass spectrometer for rapid metallomic and speciation analysis : Part 2. Atomic channel and dual-channel characterization

  • Duane A. Rogers, Steven J. Ray, Gary M. Hieftje
  • Metallomics, January 2010, Royal Society of Chemistry
  • DOI: 10.1039/b915783b

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The following have contributed to this page: Professor Gary M Hieftje