Conference report. 6th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF' 96). June 10–11, 1996, Eindhoven, Holland and June 13–14, 1996, Dortmund, Germany

Peter Beaven
  • Journal of Analytical Atomic Spectrometry, January 1996, Royal Society of Chemistry
  • DOI: 10.1039/ja996110041n

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http://dx.doi.org/10.1039/ja996110041n

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