Combined in situ atomic force microscopy and infrared attenuated total reflection spectroelectrochemistry

Daniel Neubauer, Jochen Scharpf, Alberto Pasquarelli, Boris Mizaikoff, Christine Kranz
  • The Analyst, January 2013, Royal Society of Chemistry
  • DOI: 10.1039/c3an01169k

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http://dx.doi.org/10.1039/c3an01169k

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