Multilayer nano-thickness measurement by a portable low-power Bremsstrahlung X-ray reflectometer

Abbas Alshehabi, Shinsuke Kunimura, Jun Kawai
  • Analytical Methods, January 2010, Royal Society of Chemistry
  • DOI: 10.1039/c0ay00216j
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The following have contributed to this page: Dr. Abbas Alshehabi

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