Time-resolved spatially offset Raman spectroscopy for depth analysis of diffusely scattering layers

Ingeborg E. Iping Petterson, Patrick Dvořák, Joost B. Buijs, Cees Gooijer, Freek Ariese
  • The Analyst, January 2010, Royal Society of Chemistry
  • DOI: 10.1039/c0an00611d