Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy

Utkur Mirsaidov, Serge F. Timashev, Yuriy S. Polyakov, Pavel I. Misurkin, Ibrahim Musaev, Sergey V. Polyakov
  • The Analyst, January 2011, Royal Society of Chemistry
  • DOI: 10.1039/c0an00498g
The author haven't finished explaining this publicationThe author haven't finished explaining this publication
The following have contributed to this page: Serge Timashev