Application of laser ablation inductively coupled plasma (dynamic reaction cell) mass spectrometry for depth profiling analysis of high-tech industrial materials

  • Lieve I. L. Balcaen, Jens Lenaerts, Luc Moens, Frank Vanhaecke
  • Journal of Analytical Atomic Spectrometry, January 2005, Royal Society of Chemistry
  • DOI: 10.1039/b412287a

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http://dx.doi.org/10.1039/b412287a

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