Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed on copper

  • K. Shimizu, R. Payling, H. Habazaki, P. Skeldon, G. E. Thompson
  • Journal of Analytical Atomic Spectrometry, January 2004, Royal Society of Chemistry
  • DOI: 10.1039/b400918p

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http://dx.doi.org/10.1039/b400918p

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