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The unexpected nuclear accidents have provided a challenge for scientists and engineers to develop sensitive detectors, especially for alpha radiation. Due to the high linear energy transfer value, sensors designed to detect such radiation require placement in close proximity to the radiation source. Here we report the morphological changes and optical responses of artificially designed DNA thin films in response to exposure to alpha radiation as observed by an atomic force microscope, a Raman a

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the present work shows that the changes observed in synthesized DNA thin film on exposure to alpha particles in air for a few min. are significant with respect to the topological changes observed by AFM, Raman spectrum and optical reflectance intensity changes as measured by a photo detector, on-line photo spectroscopy. Specifically, this is due to the fact that the available energy within a single alpha particle, 7.2 × 10−13 J, is sufficient in damaging 1.2 × 105 DXL units since the energy of h

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This page is a summary of: A novel nanometric DNA thin film as a sensor for alpha radiation, Scientific Reports, June 2013, Springer Science + Business Media,
DOI: 10.1038/srep02062.
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