Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser

O. Yu. Gorobtsov, N. Mukharamova, S. Lazarev, M. Chollet, D. Zhu, Y. Feng, R. P. Kurta, J.-M. Meijer, G. Williams, M. Sikorski, S. Song, D. Dzhigaev, S. Serkez, A. Singer, A. V. Petukhov, I. A. Vartanyants
  • Scientific Reports, February 2018, Springer Science + Business Media
  • DOI: 10.1038/s41598-018-19793-1

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http://dx.doi.org/10.1038/s41598-018-19793-1

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