S. A. Pai, K. V. Lohithakshan, P. D. Mithapara, S. K. Aggarwal
  • Journal of Radioanalytical and Nuclear Chemistry, January 2000, Springer Science + Business Media
  • DOI: 10.1023/a:1006742217796

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http://dx.doi.org/10.1023/a:1006742217796

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