Combined Nanoindentation and Adhesion Force Mapping Using the Atomic Force Microscope:  Investigations of a Filled Polysiloxane Coating

Peter Eaton, Francis Fernández Estarlich, Richard J. Ewen, Thomas G. Nevell, James R. Smith, John Tsibouklis
  • Langmuir, December 2002, American Chemical Society (ACS)
  • DOI: 10.1021/la0110747

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http://dx.doi.org/10.1021/la0110747

The following have contributed to this page: Dr James R Smith