What is it about?

In this study, we explored what happens to a key chemical used in computer chip manufacturing, phenyl triflate (Ph–O–SO₂–CF₃), when it’s exposed to extremely high-energy light, similar to the conditions in advanced lithography processes. This chemical helps create the fine patterns needed to build modern microchips. Using ultrafast techniques that allowed us to observe changes happening in just trillionths of a second, we watched as the molecule broke apart and rearranged. We found that it undergoes a complex reaction: sulfur dioxide (SO₂) is released, and the CF₃ group (trifluoromethyl) reattaches to form a new structure. During this process, part of the molecule also twists in a characteristic way, creating a repeating vibrational motion. By combining these real-time observations with electronic structure calculations, we were able to capture a detailed picture of how phenyl triflate behaves under these intense conditions. Our findings offer valuable insight into the ultrafast chemistry behind photoacid generators and could help improve the materials used in next-generation chip manufacturing.

Featured Image

Why is it important?

This study is important because it reveals, in real time, how a key photoacid generator used in advanced chip manufacturing breaks apart and reforms when exposed to high-energy light. We observed the ultrafast release of SO₂ and H⁺, the reattachment of the CF₃ group, and a distinct molecular twisting motion—all within trillionths of a second. These findings provide new insight into the fundamental chemistry behind EUV lithography and can help improve the design of photoactive materials, leading to more efficient, precise, and reliable processes for next-generation semiconductor fabrication.

Perspectives

This case is interesting because it involves breaking two chemical bonds to release neutral SO₂, while the CF₃ group, instead of simply flying away, reattaches to the phenoxy group.

Marcos Dantus
Michigan State University

Read the Original

This page is a summary of: Ultrafast Dynamics and Rearrangement of the EUV Photoacid Generator Phenyl Triflate, The Journal of Physical Chemistry Letters, March 2025, American Chemical Society (ACS),
DOI: 10.1021/acs.jpclett.4c03621.
You can read the full text:

Read

Contributors

The following have contributed to this page