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This page is a summary of: Experimental TDPAC and Theoretical DFT Study of Structural, Electronic, and Hyperfine Properties in (111In → )111Cd-Doped SnO2 Semiconductor: Ab Initio Modeling of the Electron-Capture-Decay After-Effects Phenomenon, The Journal of Physical Chemistry C, July 2018, American Chemical Society (ACS),
DOI: 10.1021/acs.jpcc.8b03724.
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