Adhesion Forces in Conducting Probe Atomic Force Microscopy

Alexei V. Tivanski, Jason E. Bemis, Boris B. Akhremitchev, Haiying Liu, Gilbert C. Walker
  • Langmuir, March 2003, American Chemical Society (ACS)
  • DOI: 10.1021/la026555k

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http://dx.doi.org/10.1021/la026555k

The following have contributed to this page: Haiying Liu