Raman Scattering as a Probe of Crystallinity in PTCDA and H2Pc Single-Layer and Double-Layer Thin Film Heterostructures

S. Heutz, G. Salvan, S. D. Silaghi, T. S. Jones, D. R. T. Zahn
  • The Journal of Physical Chemistry, April 2003, American Chemical Society (ACS)
  • DOI: 10.1021/jp0266392

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http://dx.doi.org/10.1021/jp0266392

The following have contributed to this page: Professor Dietrich RT Zahn