Advantages and Artifacts of Higher Order Modes in Nanoparticle-Enhanced Backscattering Raman Imaging

Zachary D. Schultz, Stephan J. Stranick, Ira W. Levin
  • Analytical Chemistry, December 2009, American Chemical Society (ACS)
  • DOI: 10.1021/ac901789w
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http://dx.doi.org/10.1021/ac901789w

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