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This page is a summary of: Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II, Microscopy and Microanalysis, September 2015, Cambridge University Press,
DOI: 10.1017/s1431927615014993.
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