Scanning Photoemission Spectromicroscopic Study of 4-nm Ultrathin SiO3.4 Protrusions Probe-Induced on the Native SiO2 Layer

Rupesh S. Devan, Shun-Yu Gao, Yu-Rong Lin, Shun-Rong Cheng, Chia-Er Hsu, Chia-Hao Chen, Hung-Wei Shiu, Yung Liou, Yuan-Ron Ma
  • Microscopy and Microanalysis, October 2011, Cambridge University Press
  • DOI: 10.1017/s1431927611011901

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http://dx.doi.org/10.1017/s1431927611011901

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