What is it about?
A two-dimensional (2D) X-ray detector can collect diffraction pattern with a given dimension. In order to expand the coverage of a diffraction pattern, a 2D detector may collect the diffraction pattern at various detector positions respect to the incident beam and sample location. This paper introduces methods to produce a diffraction pattern with an angular coverage larger than the detector coverage at a single detector position.
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Why is it important?
The algorithms provided in this paper ensures the diffraction pattern produced by combining the signals collected at various detector positions is as accurate as a diffraction pattern collected by a detector large enough to cover the final angular range with a single exposure.
Perspectives
For an X-ray diffractometer with a 2D detector, the method helps to collect diffraction pattern of desired coverage suitable for various different XRD analysis.
Bob He
Bruker Corporation
Read the Original
This page is a summary of: Geometry and algorithms to expand 2θ coverage of a 2D detector, Powder Diffraction, April 2018, Cambridge University Press,
DOI: 10.1017/s0885715618000362.
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