Delaunay Tessellation and Topological Regression: An Application to Estimating Product Properties from Spectroscopic Measurements

Francesco Corona, Elia Liitiäinen, Amaury Lendasse, Roberto Baratti, Lorenzo Sassu
  • January 2009, Elsevier
  • DOI: 10.1016/s1570-7946(09)70587-5

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The following have contributed to this page: Dr Roberto Baratti